| Title |
Anizotropinių plonų sluoksnių optinių charakteristikų priklausomybių nuo garinimo parametrų tyrimas "Investigation of the dependences of the optical characteristics of anisotropic thin films on evaporation parameters" / |
| Translation of Title |
Investigation of the dependences of the optical characteristics of anisotropic thin films on evaporation parameters. |
| Authors |
Petrauskaitė, Gabija |
| Full Text |
|
| Pages |
41 |
| Abstract [eng] |
Anisotropic thin films deposited using the glancing angle method have a larger birefringence than crystal materials. This property provides new possibilities in producing effective high quality optical elements. The aim of these experiments was to examine refractive index and birefringence dependency on deposition rate and substrate hold time. During this research refractive indices of silicon dioxide anisotropic thin films were modelled and birefringence dependence on evaporation rate and zigzag column structure segment length was determined. Higher birefringence was found in highly porous layers with zigzag segment of only a few nanometres length. It was found that layer’s structure is sensitive to high deposition rates, such as 8 Å/s. The best birefringence and phase delay was determined for layer deposited at 3 Å/s with 6 s substrate delay during the deposition which resulted in 1.8 nm length zigzag column segments. The layer also had one of the lowest surface stress values. The use of anisotropic layers was demonstrated by making a multilayer polariser for 540 nm wavelength. |
| Dissertation Institution |
Vilniaus universitetas. |
| Type |
Master thesis |
| Language |
Lithuanian |
| Publication date |
2021 |
