| Title | Silicio su taškiniais defektais elektroninių savybių charakterizavimas |
|---|---|
| Translation of Title | Characterization of electronic properties of silicon in vicinity of point defects. |
| Authors | Guigaitė, Ieva |
| Full Text |
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| Pages | 40 |
| Abstract [eng] | Point defect modelling in a silicon lattice conducted by the density functional theory (DFT) calculations. |
| Dissertation Institution | Vilniaus universitetas. |
| Type | Master thesis |
| Language | Lithuanian |
| Publication date | 2021 |