| Abstract [eng] |
The purpose of this work was to fabricate LLTO ceramics, free-standing thick films and thick films on top of an aluminum substrate as well as to investigate their electrical properties. The used material was examined using XRD method to check for purity. The samples were produced using the tape casting method and were inspected using a scanning electron microscope. Measurement data of the ceramic and films was produced using coaxial impedance spectroscopy. The tests were performed in the frequency range of 10 Hz – 10 GHz as well as in the temperature range of 300 K to 1000 K. Afterwards equivalent circuits were used to obtain the conductivity values of the samples. While the conductivity values of the LLTO film on the aluminum substrate were observed to be lower than the ceramics, the free-standing thick film results were basically identical. |
