Title Didelės energijos protonais ir neutronais sukurtų giliųjų centrų tyrimas didžiavaržio Si, SiC ir GaN dariniuose /
Translation of Title Study of the deep levels induced by the high energy proton and neutron irradiation in the structures of high resistivity Si, SiC and GaN.
Authors Kalendra, Vidmantas
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Pages 112
Keywords [eng] Si ; SiC ; GaN ; defects
Abstract [eng] Investigations made on new materials and their structures for production of particle detectors based on semi-insulating SiC and GaN comprise the technological and applied importance of this study. Innovations in defect control technology, especially, in recognition of extended defects and percolative carrier transport in heavily irradiated detector structures are considered and applied for scientific implementations. These investigations have been performed within a framework of CERN rd50 project. Irradiation by 24 GeV protons varying fluence up to 1016 cm-2 deteriorates rectifying properties of the 4H-SiC particle detectors. Different isotopes produced in 4H-SiC during irradiation by protons have been revealed by gamma spectroscopy. In the non-irradiated GaN material the temperature-dependent variations of leakage current have been unveiled to be caused by the carrier mobility temperature changes. Activation energy values have been extracted for proton radiation induced deep centres in the GaN detectors by thermally stimulated current spectroscopy as well as the isotopes and long-living radio-nuclides have been identified by gamma spectroscopy. In the Si detectors, irradiated by reactor neutrons, the photo-activation energy values have been determined for the deep levels located below the mid-gap by photo-ionisation spectroscopy while isochronal anneals enhance the density of the acceptor-type vacancy-related defects.
Type Doctoral thesis
Language Lithuanian
Publication date 2009