| Abstract [eng] |
The thesis is dedicated to investigation of carrier dynamics in SiC, GaN and diamond by using light-induced transient gratings, differential transmittivity, differential reflectivity and photoluminescence techniques. Also new absorption coefficient measurement and carrier lifetime microscopy techniques are presented. The experimental studies were performed in a wide range of excess carrier densities and temperatures under single- and two- photon excitation conditions. Strong diffusion coefficient temperature and injection dependences were determined. They were explained by phonon scattering, inter-carrier interaction processes and degeneracy. It was determined, that in indirect-gap SiC and diamond semiconductors at low injections lifetime is limited by point and surface defects, while in GaN recombination on grain boundaries prevails. Also nonlinear Auger recombination coefficient was observed. It was Coulombically enhanced at low injections and screened at high ones. Photoluminescence efficiency revealed radiative recombination coefficient reduction with injection in GaN. On the other hand, in SiC radiative coefficient was injection independent. Compensating defect (aluminum in SiC and boron in diamond) concentrations and activation energies were determined from their absorption saturation and recovery rate temperature dependences. |
