| Title |
Extending the depth of focus of an infrared microscope using a binary axicon fabricated on barium fluoride / |
| Authors |
Han, Molong ; Smith, Daniel ; Kahro, Tauno ; Stonytė, Dominyka ; Kasikov, Aarne ; Gailevičius, Darius ; Tiwari, Vipin ; Ignatius Xavier, Agnes Pristy ; Gopinath, Shivasubramanian ; Ng, Soon Hock ; John Francis Rajeswary, Aravind Simon ; Tamm, Aile ; Kukli, Kaupo ; Bambery, Keith ; Vongsvivut, Jitraporn ; Juodkazis, Saulius ; Anand, Vijayakumar |
| DOI |
10.3390/mi15040537 |
| Full Text |
|
| Is Part of |
Micromachines.. Basel : MDPI. 2024, vol. 15, iss. 4, art. no. 537, p. 1-16.. eISSN 2072-666X |
| Keywords [eng] |
axial resolution ; binary axicon ; chemical imaging ; femtosecond ablation ; infrared microscopy ; photolithography |
| Abstract [eng] |
Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable, as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on a barium fluoride substrate close to the sample. Preliminary results of imaging the thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and an increase in background noise. |
| Published |
Basel : MDPI |
| Type |
Journal article |
| Language |
English |
| Publication date |
2024 |
| CC license |
|
