| Title |
Multi-frequency digital terahertz holography within 1.39 – 4.25 THz range / |
| Authors |
Ivaškevičiūtė-Povilauskienė, Rusnė ; Grigelionis, Ignas ; Siemion, Agnieszka ; Jokubauskis, Domas ; Ikamas, Kęstutis ; Lisauskas, Alvydas ; Minkevičius, Linas ; Valušis, Gintaras |
| DOI |
10.1109/TTHZ.2024.3410670 |
| Full Text |
|
| Is Part of |
IEEE transactions on terahertz science and technology.. New York : Institute of electrical and electronics engineers (IEEE). 2024, vol. 14, iss. 5, p. 568-578.. ISSN 2156-342X. eISSN 2156-3446 |
| Keywords [eng] |
detectors ; graphene ; Holographic optical components ; Holography ; holography ; Image reconstruction ; imaging ; Laser beams ; low-absorption ; Optical imaging ; phase-shifting ; Terahertz ; Terahertz radiation |
| Abstract [eng] |
Terahertz (THz) multi-frequency digital holography within the range from 1.39 THz up to 4.25 THz is demonstrated. Holograms are recorded using an optically-pumped molecular THz laser operating at emission lines of 1.39 THz, 2.52 THz, 3.11 THz, 4.25 THz frequencies, and nanometric field effect transistor with integrated patch antennae as a THz detector. It is revealed that phase-shifting methods allow for qualitative reconstruction of multi-frequency THz holograms combined into one “coloured” image. It provides more information about the low-absorbing objects with additionally improved quality achieved by removing unwanted information related to the socalled DC term and conjugated beam forming a virtual image. It is shown that the THz holography can be applied for the investigation of low-absorbing objects, and it is illustrated via inspection of stacked graphene layers placed on a high-resistivity silicon substrate. |
| Published |
New York : Institute of electrical and electronics engineers (IEEE) |
| Type |
Journal article |
| Language |
English |
| Publication date |
2024 |
| CC license |
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