| Title |
Polarimeters for the detection of anisotropy from reflectance |
| Authors |
Kamegaki, Shuji ; Khajehsaeidimahabadi, Zahra ; Ryu, Meguya ; Le, Nguyen Hoai An ; Ng, Soon Hock ; Buividas, Ričardas ; Seniutinas, Gediminas ; Anand, Vijayakumar ; Juodkazis, Saulius ; Morikawa, Junko |
| DOI |
10.3390/mi15060794 |
| Full Text |
|
| Is Part of |
Micromachines.. Basel : MDPI. 2024, vol. 15, iss. 6, art. no. 794, p. [1-12].. eISSN 2072-666X |
| Keywords [eng] |
anisotropy ; birefringence ; four-polarisation method ; polarimetry |
| Abstract [eng] |
Polarimetry is used to determine the Stokes parameters of a laser beam. Once all four (Formula presented.) parameters are determined, the state of polarisation is established. Upon reflection of a laser beam with the defined S polarisation state, the directly measured S parameters can be used to determine the optical properties of the surface, which modify the S-state upon reflection. Here, we use polarimetry for the determination of surface anisotropies related to the birefringence and dichroism of different materials, which have a common feature of linear patterns with different alignments and scales. It is shown that polarimetry in the back-reflected light is complementary to ellipsometry and four-polarisation camera imaging; experiments were carried out using a microscope. |
| Published |
Basel : MDPI |
| Type |
Journal article |
| Language |
English |
| Publication date |
2024 |
| CC license |
|
