| Abstract [eng] |
The ferroelectric relaxor materials have recently been in focus due to their good dielectric properties such as huge dielectric permittivity in broad temperature range. Lead-free ferroelectric relaxor ceramics are potential candidates for replacing PMN, PZT, PLZT and other lead-containing and therefore toxic materials, nowadays used in various electronic devices such as electronic filters, transducers, electrooptic modulators, ferroelectric memories etc., according to the EU legislation restricting the use of hazardous substances in electrical and electronic equipment. Good examples of such materials could be ferroelectric relaxor ceramics made on basis of barium titanate dopped with lanthanum magnesium titanate or tin or ceramics with bismuth layered perovskite structure as BBT-SBT or BBN-SBN. This research paper presents dielectric measurements of these materials which is a very powerful tool that helps to define the microscopic and even macroscopic properties of the materials from the dielectric response measured in broad frequency (10-3 – 1012 Hz) and temperature (100 – 500 K) ranges. |
